英語と数学わかる方教えください！

EVALUATING FUNCTIONS The symbol f(x) represents the real number in the range of the function f corresponding to the domain value x. Symbolically, f:x → f(x). The ordered pair (x, S(x)) belongs to the function f. If xis a real number that is not in the domain of f, then fis not defined at x and f(x) does not exist. Examples: 15 a) Find f(6), S(a), and f(6+a) for f(x) x -3 b) Find g(7), g(h), and g(7+h) for g(x) 16+ 3x - x. 2 Find k(9), 4k(a), and k(4a) for k(x) Vx 2 For the above functions, determine the resulting domain. Solutions: a) b) c)

英語と数学わかる方教えください！

EVALUATING FUNCTIONS The symbol f(x) represents the real number in the range of the function f corresponding to the domain value x. Symbolically, f:x → f(x). The ordered pair (x, S(x)) belongs to the function f. If xis a real number that is not in the domain of f, then fis not defined at x and f(x) does not exist. Examples: 15 a) Find f(6), S(a), and f(6+a) for f(x) x -3 b) Find g(7), g(h), and g(7+h) for g(x) 16+ 3x - x. 2 Find k(9), 4k(a), and k(4a) for k(x) Vx 2 For the above functions, determine the resulting domain. Solutions: a) b) c)

数学苦手な上英語なのでよくわかりませんがわかる方いらっしゃたら教えください

EVALUATING FUNCTIONS The symbol f(x) represents the real number in the range of the function fcorresponding to the domain value x. Symbolically, f:x → S(x). The ordered pair (x, f(x)) belongs to the function f. If xis areal number that is not in the domain of f, then fis not defined at x and f(x) does not exist. Examples: 15 a) Find f(6), f(a), and f(6+a) for f(x) x -3 b) Find g(7), g(h), and g(7+h) for g(x) = 16+ 3x - x。 2 c) Find k(9), 4k(a), and k(4a) for k(x) = 2 For the above functions, determine the resulting domain. Solutions: a) b) c)

(I)が関数で(ii)が関数じゃないらしいのですが何故か教え欲しいです

Determine whether each set specifies a function. If it does, then state the domain and range. 2) i) S = {(I1,4), (2,3), (3,2), (4,3), (5,4)} T= {(1,4), (2,3), (3,2), (2,4), (1,5)} Solutions: i) Prepared by DZ Page 3

この問題のrangeとasymptoteを教えて頂きたいです。 問題は、Graph the equation. State the domain, range, and asymptote.です。 (asymptote:漸近線)

2.4= log;4 1|5 s |0 4 3 2 3 >2 V domain:X>0 range: y asymptote ミ

どっちのサイトがあっていますか？

How many sig figs does the number 300.0 have? 1 sig When zeros are at the right of the number: a) lf there is no decimal, the zeros are NOT significant. Example: 300 has 1 sig. www.pps.net) lib, Centricity> Domain> ib_sigfigs , DOC Rules for Counting Significant Figures

RHEED法の原理と得られる7つの情報が、この英文に書かれているみたいなのですが、よく分かりません。 分かる方助けてください！🙇‍♂️

INTRODUCTION Reection high-energy electron diHiraction (RHEED) uses a Rnely collimated electron beam with energy of 10-100 keV. The beam irradiates a sample surface with gazing incidence to obtain forward scattered difraction patterms. RHEED enables us to analyze structures of crystal surfaces at atomic levels and also to in situ monitor growth processes of thin films (mo、1988: Ichimiya and Cohen、2004: Peng et al.. 2011). From the arrangement。intensity and profile of the dilraction spots in RHEED patterns as described below in detail、 one can obtain various kinds of information: (1) the periodicity (unit cells) in atomic arrangements. (2) flat- ness of surfaces. (3) sizes of grains/domains of surface structures and microcrystals grown on the surface. (3) epitaxial relation between the grown flms/islands with respect to the substrate. (5) parameters character- izing structural phase transitions. (6) individual atomic positions in the unit cells. and (7) growth styles of thin films and numbers of atomic layers grown. The most important advantages of the method are that it is quite easy to install the RHEED apparatus in Yarious types of vacuum chambers without interfering with other components of apparatuses and to do real- time monitoring during thin-Rlm growths. Because of these advantages.RHEED is nowwidelyusednotonlyin research Iabs of surfaces and thin fims. but also in device production processes in industry Low-energy electron diiraction (LEED、see article Low-ENNERcy ErecroN DirscmoN)。 in which an electron beam of 10-100 eV in energy is irradiated onto a sample surface with nearly normal incidence to obtain back- scattered difraction patterns. is also widely used to analyze the atomic structures of crystal surfaces. Since one has to make the sample face directly to the LEED

国家主席と首相の違いは何ですか？ 中国の話です！

下線部4がうまく訳せません、、、 誰か解説と回答例お願いします。

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